The scanCONTROL sensors acquire for each measurement a 2D-profile of an object surface. These profiles can be transferred to your application as an array of points or composed in a container of several profiles. Each of these profiles consists of a certain number of calibrated measuring points, including additional information like intensity, timestamp or counter information. Besides the data transfer, the complete sensor configuration can be set up from the application.
The data transfer and the configuration of the sensors can be realized in different ways:
The scanCONTROL C/C++ library supports as well dynamic as static loading and supports stdcall and cdecl as standard call conventions. All functions are described in detail in the included interface documentation. The scanCONTROL C/C++ SDK also includes many programming examples.
The integration module scanCONTROL C/C++ SDK includes:
Interface and scanCONTROL documentation
Programming examples for C++ (e.g. triggering the sensor, container mode)
The scanCONTROL instrument driver LabVIEW supports fast integration of scanCONTROL sensors into National Instruments LabVIEW. For accessing a scanCONTROL sensor and its basic settings you can drag and drop modules directly from the function palette into your VI. Example VIs illustrating the scanCONTROL integration are also part of this package.
The integration of scanCONTROL sensors is based on the C/C++ library (LLT.DLL) of Micro-Epsilon. The detailed documentation also shows how to set up additional special sensor parameter.
The scanCONTROL instrument driver for LabVIEW:
Developed according to the LabVIEW instrument driver guidelines by National Instruments
LabVIEW 8.6 and higher supported
Comprises instrument drivers for 32Bit and 64Bit
Fast and Easy access to all settings via function palette
FireWire and Ethernet interface supported
Example VIs for single profile mode and container mode
Detailed documentation how to integrate scanCONTROL sensors into LabVIEW