Measurement of the diameter of profiles

Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.

Odporúčaná technológia snímačov

optoCONTROL 2520

MICRO-EPSILON Czech Republic
Na Libuši 891
39165 Bechyně, Czech Republic
juraj.devecka@micro-epsilon.cz
+421 911 298 922
+420 381 211 060